41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015): http://www.asminternational.org/web/ISTFA-2015/home

41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)
November 01 - 05, 2015

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Opening Session

Monday, November 2, 2015: 8:00 AM-9:10 AM
Meeting Room D135 & 136 (Oregon Convention Center )
8:00 AM
Opening Remarks: James J. Demarest
8:10 AM
ISTFA 2014 Best and Outstanding Paper Awards: James J. Demarest, Ph.D., IBM—Albany Nanotech, Physical Characterization
8:15 AM
Technical Program Chair Introduction: Sam Subramanian, Freescale Semiconductor, Inc.
8:20 AM
8:20 a.m. IPFA Best Paper Presentation: Fault Isolation using Electrically-Enhanced LADA (EeLADA) by S.H. Goh
8:45 AM
2015 ESREF Best Paper Presentation, Michél Simon-Najasek
See more of: Technical Program
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General Information

November 01 - 05, 2015


Portland, OR