Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation
Sunday, November 6, 2016: 1:00 PM
110B (Fort Worth Convention Center)
Mr. Steven B. Herschbein
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Carmelo F. Scrudato
,
Globalfoundries, Hopewell Junction, NY
Mr. George K. Worth
,
Globalfoundries, Hopewell Junction, NY
Mr. Edward S. Hermann
,
Globalfoundries, Hopewell Junction, NY
Mr. Raymond Wagner
,
Globalfoundries, Hopewell Junction, NY
Mr. Oleg Sidorov
,
FEI Company, Hillsboro, OR
Mr. Christopher M. Scheffler
,
Intel Corporation, Santa Clara, CA
Dr. Shida Tan
,
Intel Corporation, Santa Clara, CA
Mr. Richard H. Livengood
,
Intel Corporation, Santa Clara, CA
