Sunday, November 6, 2016: 1:00 PM-6:00 PM
110B (Fort Worth Convention Center)
Microscopy
Session Chairs: Mr. Steven B. Herschbein, GLOBALFOUNDRIES, Hopewell Junction, NY and Dr. William E. Vanderlinde, Laboratory for Physical Sciences, College Park, MD
1:00 PM
Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation
Mr. Steven B. Herschbein, GLOBALFOUNDRIES;
Mr. Carmelo F. Scrudato, Globalfoundries;
Mr. George K. Worth, Globalfoundries;
Mr. Edward S. Hermann, Globalfoundries;
Mr. Raymond Wagner, Globalfoundries;
Mr. Oleg Sidorov, FEI Company;
Mr. Christopher M. Scheffler, Intel Corporation;
Dr. Shida Tan, Intel Corporation;
Mr. Richard H. Livengood, Intel Corporation
