42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Flip Chip and Backside Techniques
Sunday, November 6, 2016: 9:00 AM
110B (Fort Worth Convention Center)
Dr. Edward I. Cole Jr.
,
Sandia National Laboratories, Albuquerque, NM
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Package and Physical Analysis Challenges I
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Tutorial