42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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LADA and SDL: Powerful Techniques for Marginal Failures
Sunday, November 6, 2016: 1:00 PM
108 (Fort Worth Convention Center)
Mr. Dan Bodoh
,
NXP Semiconductors, Austin, TX
Mr. Kent Erington
,
NXP Semiconductors, Austin, TX
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Fault Isolation
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