42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016): http://www.asminternational.org/web/istfa-2016/home

42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016

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Mr. Patrick Pardy

Intel Corp.
MS JF4-213
Hillsboro, OR
USA 97123

Papers:

Visible Laser Probing (VLP) with GaP Solid Immersion Lens Demonstrating 110 nm Resolution in Common Laser Probing Applications

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General Information

November 06 - 10, 2016


Fort Worth, TX