42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Ms. Sweta Pendyala
Globalfoundries
Hopewell Junction, NY
USA 12533
Papers:
Root Cause Analysis for Pin Leakage
Diamond Probe Applications for Nanoprobing