Diamond Probe Applications for Nanoprobing
Diamond Probe Applications for Nanoprobing
Monday, November 7, 2016: 1:00 PM
110AB (Fort Worth Convention Center)
Summary:
This paper explores a novel approach to simplify a given circuit and localize the failing finger by cutting metal lines using diamond nanoprobes on the FEI Hyperion AFP. It also describes some other applications of diamond nanoprobes on semiconductor samples.
This paper explores a novel approach to simplify a given circuit and localize the failing finger by cutting metal lines using diamond nanoprobes on the FEI Hyperion AFP. It also describes some other applications of diamond nanoprobes on semiconductor samples.