42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Mr. Christopher Rowlett
Neocera LLC
Beltsville, MD
USA 20705
Papers:
3D Fault Isolation in 2.5D Device comprising High Bandwidth Memory (HBM) Stacks and Processor Unit Using 3D Magnetic Field Imaging