42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Mr. Klaus Schock
Kleindiek Nanotechnik
Reutlingen Germany 72770
Papers:
Combining Current Imaging, EBIC/EBAC, and Electrical Probing for fast and reliable in situ Electrical Fault Isolation
