Combining Current Imaging, EBIC/EBAC, and Electrical Probing for fast and reliable in situ Electrical Fault Isolation

Thursday, November 10, 2016: 1:20 PM
108 (Fort Worth Convention Center)
Dr. Stephan Kleindiek , Kleindiek Nanotechnik, Reutlingen, Germany
Dr. Matthias Kemmler , Kleindiek Nanotechnik, Reutlingen, Germany
Mr. Andreas Rummel , Kleindiek Nanotechnik, Reutlingen, Germany
Mr. Klaus Schock , Kleindiek Nanotechnik, Reutlingen, Germany

Summary:

Current Imaging yields similar results to methods known as pico-Current imaging or other conductive AFM methods, but in a fraction of the time.
See more of: Scanning Probe Analysis II
See more of: Technical Program