Combining Current Imaging, EBIC/EBAC, and Electrical Probing for fast and reliable in situ Electrical Fault Isolation
Combining Current Imaging, EBIC/EBAC, and Electrical Probing for fast and reliable in situ Electrical Fault Isolation
Thursday, November 10, 2016: 1:20 PM
108 (Fort Worth Convention Center)
Summary:
Current Imaging yields similar results to methods known as pico-Current imaging or other conductive AFM methods, but in a fraction of the time.
Current Imaging yields similar results to methods known as pico-Current imaging or other conductive AFM methods, but in a fraction of the time.