42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016): http://www.asminternational.org/web/istfa-2016/home

42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016

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Dr. Ulrike Kindereit

Qualcomm Technologies, Inc
SAN DIEGO, CA
USA 92121

Papers:

Electrical Invasiveness of Grinding and Polishing Advanced Silicon Integrated Circuits to Ultra-thin Remaining Silicon Thickness

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General Information

November 06 - 10, 2016


Fort Worth, TX