42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Sylvain DUDIT
ST Microelectronics Crolles 2
EFA Design
Crolles France 38920
Papers:
Study of 1340 nm continuous emission laser invasiveness on 28 nm advanced technologies