Study of 1340 nm continuous emission laser invasiveness on 28 nm advanced technologies
Monday, November 7, 2016: 1:00 PM
113 (Fort Worth Convention Center)
Mr. Maxime Penzes
,
ST Microelectronics Crolles 2, Crolles, France
Mr. Sylvain DUDIT
,
ST Microelectronics Crolles 2, Crolles, France
Mr. Michel Vallet
,
ST Microelectronics Crolles 2, Crolles, France
Mr. Thierry Parrassin
,
ST Microelectronics Crolles 2, Crolles, France
Prof. Dean Lewis
,
IMS laboratory, University of Bordeaux, Talence, France
Dr. Philippe Perdu
,
CNES - French Space Agency, Toulouse, France
