42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Il Woo Jung
Sungkyunkwan University
Suwon Korea, The Republic of 16419
Papers:
Body Effect Measurement in DRAM Cell Transistor using Memory Test system
