Body Effect Measurement in DRAM Cell Transistor using Memory Test system
Wednesday, November 9, 2016
Mr. Il Woo Jung
,
Sungkyunkwan University, Suwon, Korea, The Republic of
Mr. Bonggu Sung
,
Samsung Electronics Company, Hwasung, Korea, The Republic of
Mr. Daejung Kim
,
Samsung Electronics Company, Hwasung, Korea, The Republic of
Dr. Ilgweon Kim
,
Samsung Electronics Company, Hwasung, Korea, The Republic of
Dr. Hyoungsub Kim
,
Samsung Electronics Company, Hwasung, Korea, The Republic of
Dr. Gyoyoung Jin
,
Samsung Electronics Company, Hwasung, Korea, The Republic of
Prof. Byoungdeok Choi
,
Sungkyunkwan University, Suwon, Korea, The Republic of
