42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Ms. Tara Nylese
Evans Analytical Group
Sunnyvale, CA
USA 94086
Papers:
EDS Mapping of Thin Surface Films – Evaluating the Practical Limits of Low kV Imaging and Microanalysis with Low Energy M Lines, Silicon Drift Detectors and High Transmission SiN Windows by Plasma Removal of Carbon and Oxygen