Case Studies and FA Process II

Tuesday, November 8, 2016: 10:45 AM-12:00 PM
110AB (Fort Worth Convention Center)
Chairs:  Dr. Yan Li, Intel, Chandler, AZ
Co-chairs:  Mr. Apek Mulay, Mulay's Consultancy Services, Tustin, CA and Ms. Jaya Chowdhury, Chem Trace, Fremont, CA
10:45 AM
Solving the Voltage Contrast on floating substrate with standard FA toolset
Mr. Julien Goxe, NXP semiconductor; Dr. Marie Castignolles, NXP semiconductor; Mr. Thomas Zirilli, NXP semiconductor; Mrs. Beatrice vanhuffel, NXP semiconductor
11:10 AM
An analysis of Random Telegraph Signal (RTS) noise in a precise analog circuit
Dr. Yuguo Wang, Texas Instruments; Dr. Tathagata Chatterjee, Texas Instruments; Dr. Weidong Tian, Texas Instruments; Dr. Raj Aggarwal, Texas Instruments; Scott Balster, Texas Instruments; Greg Cestra, Texas Instruments; Steven Howard, Texas Instruments; Chris Barr, Texas Instruments; Alxander Reyes, Texas Instruments
11:35 AM
Case Study – Failure Analysis of a Multiplexer
Mr. Michael D. Woo, Raytheon; Mr. Marcos Campos, Raytheon; Mr. Luigi L. Aranda, Raytheon
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