42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016
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Technical Program
Monday, November 7, 2016
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8:00 AM-9:15 AM
Introduction - Opening Session
9:15 AM-9:35 AM
Morning Refreshment Break
9:35 AM-11:40 AM
Emerging FA Techniques and Concepts
Session Chair: Dr. Jeffrey Lam and Mr. Dan Bodoh
11:40 AM-12:35 PM
Lunch
12:35 PM-1:50 PM
Nanoprobing and Electrical Characterization I
Session Chair: Mr. Randall Mulder and Ms. Sweta Pendyala
12:35 PM-2:15 PM
Device FA
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane
Sample Preparation and Device Deprocessing
Session Chair: Dr. Zhigang Song and Dr. Erwin Hendarto
2:15 PM-2:25 PM
Afternoon Refreshment Break
2:25 PM-3:40 PM
Case Studies and FA Process I
Session Chair: Dr. Yan Li, Mr. Apek Mulay and Ms. Jaya Chowdhury
Nanoprobing and Electrical Characterization II
Session Chair: Mr. Randall Mulder and Ms. Sweta Pendyala
Reverse Engineering I
Session Chair: Prof. Domenic Forte, PhD and Dr. Juana Rudati
3:40 PM-5:40 PM
NanoProbing User Group
Session Chair: Mr. Nicholas Antoniou and Dr. Jaya (Vijay) Chowdhury
Sample Prep / 3D Package Prep User Group
Session Chair: Mr. Nathan Bakken and Dr. Roger Stierman
5:00 PM-6:45 PM
Tools of the Trade Tour
7:00 PM-10:00 PM
Social Event - Billy Bob's Texas
Tuesday, November 8, 2016
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Tuesday
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9:15 AM-10:30 AM
Plenary Session
10:30 AM-10:45 AM
Morning Refreshment Break
10:45 AM-12:00 PM
Board and System Level FA I
Session Chair: Mr. Robert Champaign and Mr. Jason Wheeler
Case Studies and FA Process II
Session Chair: Dr. Yan Li, Mr. Apek Mulay and Ms. Jaya Chowdhury
12:00 PM-1:30 PM
Lunch on Show Floor
1:30 PM-2:20 PM
Board and System Level FA II
Session Chair: Mr. Robert Champaign and Mr. Jason Wheeler
2:20 PM-2:55 PM
Afternoon Refreshment Break
2:55 PM-5:00 PM
FIB Circuit Analysis and Edit
Session Chair: Mr. Richard Livengood and Mr. Jason M. Benz, BS/MS Microelectronic Eng & Materials Science
Reverse Engineering II
Session Chair: Prof. Domenic Forte, PhD and Dr. Juana Rudati
5:00 PM-6:40 PM
Expo Networking Reception
Wednesday, November 9, 2016
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Tuesday
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8:00 AM-9:40 AM
3D Devices Failure Analysis
Session Chair: Mr. Frank Altmann and Ms. Claudia Keller
Scanning Probe Analysis I
Session Chair: Mrs. Rosalinda-Mendoza Ring and Mr. David L. Burgess
9:40 AM-10:10 AM
Morning Refreshment Break
10:10 AM-12:15 PM
Panel Discussion: Next generation of FA engineer
12:15 PM-1:30 PM
EDFAS Luncheon and General Membership Meeting
Lunch
1:30 PM-3:30 PM
3D Devices Failure Analysis - Poster
Session Chair: Mr. Frank Altmann and Ms. Claudia Keller
Board and System Level FA - Poster
Session Chair: Mr. Robert Champaign and Mr. Jason Wheeler
Case Studies and FA Process - Poster
Session Chair: Dr. Yan Li, Mr. Apek Mulay and Ms. Jaya Chowdhury
Detecting and Preventing Counterfeit Microelectronics - Poster
Session Chair: Dr. Navid Asadi and Mr. Michael D. Woo
Device FA - Poster
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane
Emerging FA Techniques and Concepts - Poster
Session Chair: Jeffrey Lam and Mr. Dan Bodoh
FIB Circuit Analysis and Edit - Poster
Session Chair: Mr. Richard H. Livengood and Mr. Jason M. Benz, BS/MS Microelectronic Eng & Materials Science
FIB Sample Preparation - Poster
Session Chair: Dr. Bryan Tracy, PhD
Fault Isolation - Poster
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong
Local Student Poster Session
Microscopy - Poster
Session Chair: Mr. Ted Kolasa and Dr. Yu Zhu
Nanoprobing and Electrical Characterization - Poster
Session Chair: Mr. Randall Mulder and Ms. Sweta Pendyala
Packaging and Assembly Level FA - Poster
Session Chair: Mr. Bhanu P. Sood and Ms. Becky Holdford
Poster Session / Video Contest / Dessert Reception
Reverse Engineering - Poster
Session Chair: Prof. Domenic Forte, PhD and Dr. Juana Rudati
Sample Preparation and Device Deprocessing - Poster
Session Chair: Dr. Zhigang Song and Dr. Erwin Hendarto
Scanning Probe Analysis - Poster
Session Chair: Mrs. Rosalinda-Mendoza Ring and Mr. David L. Burgess
3:30 PM-6:00 PM
Case Studies and FA Process III
Session Chair: Dr. Yan Li, Mr. Apek Mulay and Ms. Jaya Chowdhury
Microscopy
Session Chair: Mr. Ted Kolasa and Dr. Yu Zhu
Thursday, November 10, 2016
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8:00 AM-9:40 AM
FIB Sample Preparation
Session Chair: Dr. Bryan Tracy, PhD
Fault Isolation I
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong
9:40 AM-9:50 AM
Morning Refreshment Break
9:50 AM-11:55 AM
Detecting and Preventing Counterfeit Microelectronics
Session Chair: Dr. Navid Asadi and Mr. Michael D. Woo
Packaging and Assembly Level FA
Session Chair: Mr. Bhanu P. Sood and Ms. Becky Holdford
11:55 AM-12:55 PM
Lunch
12:55 PM-2:20 PM
Fault Isolation II
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong
Scanning Probe Analysis II
Session Chair: Mrs. Rosalinda-Mendoza Ring and Mr. David L. Burgess
2:20 PM-2:30 PM
Afternoon Refreshment Break
2:30 PM-4:30 PM
Contactless Fault Isolation User Group
Session Chair: Patrick Pardy and Mr. Dan Bockelman
FIB User Group
Session Chair: Mr. Steven B. Herschbein and Mr. Dane Scott