42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016): http://www.asminternational.org/web/istfa-2016/home

42nd International Symposium for Testing and Failure Analysis (November 6-10, 2016)
November 06 - 10, 2016

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FIB User Group

Thursday, November 10, 2016: 2:30 PM-4:30 PM
110AB (Fort Worth Convention Center)
Chairs:  Mr. Steven B. Herschbein, GLOBALFOUNDRIES, Hopewell Junction, NY
Co-chairs:  Mr. Dane Scott, Intel Corporation, Folsom, CA
2:30 PM
FIB Nano-patterning additional detail / deep dive; Ken Lagarec, Fibics, Inc
2:50 PM
Old FIB tricks with new Conductive Polymers; Valery Ray, PBS&T, MEO Engineering Company
3:10 PM
A novel Software Approach to TEM Sample Lift-out using the Lift-Out Shuttle; Stephan Kleindiek, Kleindiek Nanotechnik GmbH
3:30 PM
TEM Prep Goes Forth – Ready for Seven; Richard Young, Thermo Fisher Scientific
3:50 PM
UHV FIB-SEM; Ed Principe, Tescan USA
4:10 PM
Capping and Coatings for FIB XTEM; Bryan Tracy, EAG Laboratories
See more of: Technical Program
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General Information

November 06 - 10, 2016


Fort Worth, TX