43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017): Nanoscale Strain Mapping via Photo-induced Force Microscopy (PiFM)

Nanoscale Strain Mapping via Photo-induced Force Microscopy (PiFM)

Tuesday, November 7, 2017: 2:35 PM

Ballroom A (Pasadena Convention Center)

Dr. Sung Park , Molecular Vista, San Jose, CA

See more of: Scanning Probe Analysis
See more of: Technical Program