STUDENT PAPER: Making synchrotron tomography a routine tool for 3D integration failure analysis through a limited number of projections, an adapted sample preparation scheme, and a fully-automated post-processing

Monday, November 6, 2017: 3:00 PM
Ballroom A (Pasadena Convention Center)
Ms. Alexandra fraczkiewicz , CEA, LETI, MINATEC Campus, Grenoble, France
Mr. Pierre-Olivier Autran , ESRF, Grenoble, France
Dr. Ennio Capria , ESRF, Grenoble, France
Dr. Peter Cloetens , ESRF, Grenoble, France
Dr. Julio Da silva , ESRF, Grenoble, France
Dr. Sandrine Lhostis , STMicroelectronics, Crolles, France
Dr. Frederic Lorut , STMicroelectronics, Crolles, France
Dr. Stéphane Moreau , Univ. Grenoble Alpes, Grenoble, France
Thierry Mourier , Univ. Grenoble Alpes, Grenoble, France
Dr. Pierre Bleuet , Univ. Grenoble Alpes, Grenoble, France

See more of: 3D Devices Failure Analysis
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