43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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Quantitative FIB-SEM 3D Tomography for Failure Analysis
Wednesday, November 8, 2017
Dr. zhipeng li
,
Western Digital, Fremont, CA
Dr. jianxin fang
,
Western Digital, Fremont, CA
Dr. Haifeng Wang, PhD
,
Western Digital Corporation, Fremont, CA
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