Power Spectrum Analysis

Tuesday, November 7, 2017: 11:35 AM
Ballroom A (Pasadena Convention Center)
Dr. Paiboon Tangyunyong , Sandia National Laboratories, Albuquerque, NM
Dr. Edward I. Cole, Jr , Sandia National Laboratories, Albuquerque, NM
Dr. Guillermo M. Lourbriel , Sandia National Laboratories, Albuquerque, NM
Dr. Joshua Beutler , Sandia National Laboratories, Albuquerque, NM
Ms. Darlene M. Udoni , Sandia National Laboratories, Albuquerque, NM
Dr. Biliana S. Paskaleva , Sandia National Laboratories, Albuquerque, NM
Dr. Thomas E. Buchheit , Sandia National Laboratories, Albuquerque, NM

Summary:

We present a new, non-destructive electrical technique, Power Spectrum Analysis (PSA) with off-normal biasing. Off-normal biasing refers to unconventional ways of biasing microelectronics devices. PSA with off-normal biasing can be used to detect subtle differences between microelectronics devices. These differences, in many cases, cannot be detected by conventional electrical testing. PSA has been used for various applications. In this paper, we will highlight applications that are related to aging and counterfeit detection.
See more of: Detecting and Preventing Counterfeit Microelectronics
See more of: Technical Program