Detecting and Preventing Counterfeit Microelectronics

Tuesday, November 7, 2017: 11:10 AM-12:00 PM
Ballroom A (Pasadena Convention Center)
Mr. Luigi L. Aranda, Raytheon and Mr. Michael D. Woo, Raytheon
11:10 AM
Battelle Barricade: Microelectronic Device Authentication and Counterfeit Detection Utilizing Power Analysis
Mr. Thomas bergman, Battelle; Dr. Katie liszewski, Battelle
11:35 AM
Power Spectrum Analysis
Dr. Paiboon Tangyunyong, Sandia National Laboratories; Dr. Edward I. Cole, Jr, Sandia National Laboratories; Dr. Guillermo M. Lourbriel, Sandia National Laboratories; Dr. Joshua Beutler, Sandia National Laboratories; Ms. Darlene M. Udoni, Sandia National Laboratories; Dr. Biliana S. Paskaleva, Sandia National Laboratories; Dr. Thomas E. Buchheit, Sandia National Laboratories
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