43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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Study on development behavior and mechanism of delamination by NCF material under uHAST Condition
Wednesday, November 8, 2017
Ms. Ju Young KIM
,
SK Hynix, Icheon, Korea, Republic of (South)
Mr. Hyoung Ryeun Kim
,
SK Hynix, Icheon, Korea, Republic of (South)
Mr. Sung Min Hwang
,
SK Hynix, Icheon, Korea, Republic of (South)
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3D Devices Failure Analysis - Poster
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