STUDENT PAPER: Debugging Signal Corruption in Scan Chain using Phase Laser Voltage Imaging
STUDENT PAPER: Debugging Signal Corruption in Scan Chain using Phase Laser Voltage Imaging
Thursday, November 9, 2017: 2:45 PM
Ballroom A (Pasadena Convention Center)
Summary:
Laser Voltage imaging (LVI) is an established technique for isolating scan chain failures, especially those that are stuck-at a particular state. Enhancements such as second harmonic mapping have been beneficial in detecting a fault that is not stuck, but caused a shift in duty-cycle of the injected signal. Here, we describe Phase LVI constructed by integrating a lock-in amplifier as an enhancement to LVI for studying the relative phases between scan flops. Additionally we showcase a case study of successful fault isolation using phase LVI, where traditional LVI techniques weren’t successful
Laser Voltage imaging (LVI) is an established technique for isolating scan chain failures, especially those that are stuck-at a particular state. Enhancements such as second harmonic mapping have been beneficial in detecting a fault that is not stuck, but caused a shift in duty-cycle of the injected signal. Here, we describe Phase LVI constructed by integrating a lock-in amplifier as an enhancement to LVI for studying the relative phases between scan flops. Additionally we showcase a case study of successful fault isolation using phase LVI, where traditional LVI techniques weren’t successful
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See more of: Technical Program
See more of: Technical Program