Defect localization by Lock-in-Thermography

Sunday, November 5, 2017: 10:20 AM
Ballroom C (Pasadena Convention Center)
Mr. Frank Altmann , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Germany
Dr. Sebastian Brand , Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle, Germany

See more of: Fault Isolation I
See more of: Tutorial