Fault Isolation I

Sunday, November 5, 2017: 10:20 AM-2:30 PM
Ballroom C (Pasadena Convention Center)
n/a Dr. Mayue Xie, Intel and Mr. Frank Altmann, Fraunhofer Institute for Microstructure of Materials and Systems IMWS
10:20 AM
Defect localization by Lock-in-Thermography
Mr. Frank Altmann, Fraunhofer Institute for Microstructure of Materials and Systems IMWS; Dr. Sebastian Brand, Fraunhofer Institute for Microstructure of Materials and Systems IMWS
11:20 AM
Photonic Localization Techniques
Prof. Christian Boit, Technische Universitaet Berlin
12:20 PM
Lunch
1:00 PM
LADA and SDL: Powerful Techniques for Marginal Failures
Mr. Dan Bodoh, NXP Semiconductors; Mr. Kent Erington, NXP Semiconductor
See more of: Tutorial
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