Non-Destructive Fault Localization in 2.5D Packages Using Electro Optical Terahertz Pulse Reflectometry

Monday, November 6, 2017: 3:50 PM
Ballroom A (Pasadena Convention Center)
Ms. Bernice Zee , AMD, Singapore, Singapore
Mr. W Qui , AMD, Singapore, Singapore
Dr. Jesse Alton , TeraView Limited, Cambridge, United Kingdom
Dr. Thomas White , TeraView Limited, Cambridge, United Kingdom
Mr. Martin Igarashi , TearView Limited, Cambridge, United Kingdom

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