Practicality of Single Microscope Failure Analysis for Fault Isolation, Analysis and Advanced TEM Sample Preparation by the Integration EBAC and EDS on FIBSEM

Thursday, November 9, 2017: 9:15 AM
Ballroom C (Pasadena Convention Center)
Dr. John Lindsay , Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Dr. James T. Sagar , Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Dr. James Holland , Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Dr. Jenny Goulden , Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom

See more of: FIB Sample Preparation
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