Using Volume Scan Diagnosis and Data Mining in the Electrical Failure Analysis Flow for Production Yield Ramp

Wednesday, November 8, 2017
Mr. Wu yang , Mentor Graphics, Wilsonville, OR
Mr. Hao Shen , Hisilicon Technologies Co. Ltd.), shanghai, China
Mr. Lance Shen , Semiconductor Manufactory International Corporation, Shanghai, China
Mr. Jia Xu , Semiconductor Manufactory International Corporation, Shanghai, China
Dr. Wu-Tung Cheng , Mentor Graphics, Wilsonville, OR
Ms. Junna Zhong , Mentor Graphics, Shanghai, China
Mr. Jayant DSouza , Mentor Graphics, Wilsonville, OR

Summary:

In this paper, we discuss a new electrical failure analysis method incorporating scan volume diagnosis and data mining to identify root cause and enable economic physical failure analysis.
See more of: Product Yield, Test & Diagnostics - Poster
See more of: Technical Program