Product Yield, Test & Diagnostics - Poster

Wednesday, November 8, 2017: 1:30 PM-3:30 PM
Dr. Manish Sharma, Mentor, A Siemens Business and Mr. Sounil Biswas, Cavium Inc.
STUDENT PAPER: An Advanced Diagnosis Flow for SRAMs
Mr. Tien-Phu HO, LIRMM - University of Montpellier/CNRS; Mr. Eric FAEHN, STMicrolectronics; Dr. Arnaud Virazel, LIRMM - University of Montpellier/CNRS; Dr. Alberto Bosio, LIRMM - University of Montpellier/CNRS; Prof. Patrick Girard, LIRMM - University of Montpellier/CNRS
Using Volume Scan Diagnosis and Data Mining in the Electrical Failure Analysis Flow for Production Yield Ramp
Mr. Wu yang, Mentor Graphics; Mr. Hao Shen, Hisilicon Technologies Co. Ltd.); Mr. Lance Shen, Semiconductor Manufactory International Corporation; Mr. Jia Xu, Semiconductor Manufactory International Corporation; Dr. Wu-Tung Cheng, Mentor Graphics; Ms. Junna Zhong, Mentor Graphics; Mr. Jayant DSouza, Mentor Graphics
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