43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017): Laser Silicon Interaction Study on Ring Oscillators to establish Temperature Voltage Dependency trends on 14nm and future FinFET technologies.

Laser Silicon Interaction Study on Ring Oscillators to establish Temperature Voltage Dependency trends on 14nm and future FinFET technologies.

Thursday, November 9, 2017: 8:25 AM

Ballroom A (Pasadena Convention Center)

Mr. Gaurav S. Mattey , Qualcomm Technologies, Inc., San Diego, CA

Dr. Lavakumar Ranganathan , Qualcomm Technologies Inc., San Diego, CA

See more of: Fault Isolation II
See more of: Technical Program