Battelle Barricade: Microelectronic Device Authentication and Counterfeit Detection Utilizing Power Analysis

Tuesday, November 7, 2017: 11:10 AM
Ballroom A (Pasadena Convention Center)
Mr. Thomas bergman , Battelle, Columbus, OH
Dr. Katie liszewski , Battelle, Columbus, OH


Battelle has developed a technology to nondestructively classify electronic components as authentic or counterfeit. The technology uses a method that creates feature vectors for each class of devices using a reconfigurable side channel power analysis test fixture. The power waveforms are processed, undergo dimensionality reduction techniques, and the resultant data is plotted in PCA space to provide information related to the authenticity of the device under test. To support the development of this technology, unique tools have been created to provide automated generation and scoring of the input test vectors.