Using Electrical Fault Isolation & Characterization to Improve the Effectiveness of Physical Fault Isolation Techniques for Analog Circuits

Monday, November 6, 2017: 1:10 PM
Ballroom A (Pasadena Convention Center)
Mr. Jim Douglass , Analog Devices, Milpitas, CA
Mr. Sohrab Pourmand , Analog Devices, Milpitas, CA

Summary:

This paper demonstrates with two examples how electrical fault isolation and characterization can greatly improve the sensitivity of physical fault isolation tools to identify the defect location.