A novel method/model for fault localization of a subtle open on a large thin-film resistor, using Photon Emission Microscopy (PEM) technique and electric field (F-PE) mechanism

Monday, November 6, 2017: 12:45 PM
Ballroom A (Pasadena Convention Center)
Mr. Vikash Kumar , Analog Devices, Milpitas, CA
Marian Udrea Spenea , Analog Devices, Milpitas, CA

See more of: Mixed Mode & High Power Devices Case Studies
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