STUDENT PAPER: Acceptable laser dose of 28 nm FDSOI technology - Correlation of experiment and simulation

Wednesday, November 8, 2017
Mr. Maxime Penzes , ST Microelectronics Crolles 2, Crolles, France
Sylvain Dudit , ST Microelectronics Crolles 2, Crolles, France
Mr. Thierry Parrassin , ST Microelectronics Crolles 2, Crolles, France
Prof. Dean Lewis , IMS laboratory, Talence, France
Dr. Philippe PERDU , Centre National d'Etudes Spatiales (CNES), Toulouse, France

See more of: Fault Isolation - Poster
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