Fault Isolation - Poster

Wednesday, November 8, 2017: 1:30 PM-3:30 PM

Mr. Kent Erington, NXP Semiconductor and Dr. Keith A. Serrels, NXP Semiconductors

STUDENT PAPER: Acceptable laser dose of 28 nm FDSOI technology - Correlation of experiment and simulation
Mr. Maxime Penzes, ST Microelectronics Crolles 2; Sylvain Dudit, ST Microelectronics Crolles 2; Mr. Thierry Parrassin, ST Microelectronics Crolles 2; Prof. Dean Lewis, IMS laboratory; Dr. Philippe PERDU, Centre National d'Etudes Spatiales (CNES)

Fault Localization by Finding Schematic of Devices Connecting All Emission Sites in Photon Emission Microscope Image
Mr. Ankush Oberai, Synopsys Inc, Synopsys Inc; Dr. Jiann-Shiun Yuan, University of Central Florida, University of Central Florida

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