Case study: Lock-in Thermography (LIT) application in failure analysis of a system level DC-DC µmodule regulator

Tuesday, November 7, 2017: 11:35 AM
Ballroom C (Pasadena Convention Center)
Mr. Vikash Kumar , Analog Devices, Milpitas, CA
Mr. Devraj karthikeyan , Analog Devices, Milpitas, CA

See more of: Board and System Level FA
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