Board and System Level FA

Tuesday, November 7, 2017: 11:10 AM-12:00 PM
Ballroom C (Pasadena Convention Center)
Mr. Jason Wheeler, Raytheon and Mr. Bhanu P. Sood, NASA Goddard Space Flight Center
11:10 AM
Fault Isolation of Leakage for Device with Non-uniform Epoxy Encapsulation
Mr. KE-YING LIN, NXP Semiconductors
11:35 AM
Case study: Lock-in Thermography (LIT) application in failure analysis of a system level DC-DC µmodule regulator
Mr. Vikash Kumar, Analog Devices; Mr. Devraj karthikeyan, Analog Devices
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