STUDENT PAPER: Laser Voltage Tracing for Electrical Fault Isolation of Circuits propagating Aperiodic Signals

Thursday, November 9, 2017: 9:15 AM
Ballroom A (Pasadena Convention Center)
Mr. Venkat Ravikumar , SIngapore University of Technology and Design, Singapore, Singapore
Mr. Gopinath ranganathan , Advanced Micro Devices - Singapore Pte Ltd1, Singapore, Singapore
SL Phoa , Advanced Micro Devices - Singapore Pte Ltd, Singapore, Singapore
Prof. KL pey , Singapore University of Technology and Design, Singapore, Singapore
Mr. Neel Leslie , FEI Company, Fremont, CA
Mr. Christopher Nemirow, Ph.D , FEI Company, Fremont, CA

Summary:

Laser Voltage imaging (LVI) and its derivatives are established techniques for isolating broken scan/JTAG chains which work on periodic signals, but are ineffective when debugging an aperiodic signal. Laser Voltage probing works on 1 transistor at a time making it slow for certain debug. Laser voltage tracing (LVT) presented recently has opportunity to perform an area investigation of aperiodic signals
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