Focused Ion Beam (FIB) Chip Circuit Edit & Fault Isolation
Sunday, November 5, 2017: 8:00 AM
Ballroom B (Pasadena Convention Center)
Mr. Steven B. Herschbein
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Dr. Shida Tan
,
Intel Corporation, Santa Clara, CA
Mr. Carmelo F. Scrudato
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Richard H. Livengood
,
Intel Corporation, Santa Clara, CA
Mr. Edward S. Hermann
,
GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Oleg Sidorov
,
Thermo Fisher Scientific, Hillsboro, OR
Mr. Raymond L. Wagner
,
GLOBALFOUNDRIES, Hopewell Junction, NY
