Microscopy

Sunday, November 5, 2017: 8:00 AM-2:30 PM
Ballroom B (Pasadena Convention Center)
n/a Ms. Susan Li, Cypress Semiconductor and Ms. Rose Ring, Kionix
8:00 AM
Focused Ion Beam (FIB) Chip Circuit Edit & Fault Isolation
Mr. Steven B. Herschbein, GLOBALFOUNDRIES; Dr. Shida Tan, Intel Corporation; Mr. Carmelo F. Scrudato, GLOBALFOUNDRIES; Mr. Richard H. Livengood, Intel Corporation; Mr. Edward S. Hermann, GLOBALFOUNDRIES; Mr. Oleg Sidorov, Thermo Fisher Scientific; Mr. Raymond L. Wagner, GLOBALFOUNDRIES
9:00 AM
Transmission Electron Microscopy
Dr. Sam Subramanian, NXP Semiconductors
10:00 AM
Break
10:20 AM
Optical and infrared microscopy
Mr. John J. McDonald, Latigo Optics Inc.
11:20 AM
Common and Novel AFM Techniques and Applications in Semiconductor Failure Analysis and High Resolution Device Characterization
Mr. Oskar Amster, PrimeNano, Inc.
12:20 PM
Lunch
1:00 PM
Scanning Electron Microscopy and Energy Dispersive X-ray Spectroscopy
Dr. William E. Vanderlinde, Laboratory for Physical Sciences
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