43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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Application of AFP nanoprobing light induced photovoltaic current in the failure analysis
Wednesday, November 8, 2017
Dr. C.Q. Chen
,
GLOBALFOUNDRIES Singapore Pte Ltd, Singapore, Singapore
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Nanoprobing and Electrical Characterization - Poster
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Technical Program