Nanoprobing and Electrical Characterization - Poster

Wednesday, November 8, 2017: 1:30 PM-3:30 PM
Mr. John Sanders, DCG Systems and Ms. Sweta Pendyala, Globalfoundries
Application of AFP nanoprobing light induced photovoltaic current in the failure analysis
Dr. C.Q. Chen, GLOBALFOUNDRIES Singapore Pte Ltd
Resolve of OTP Failures through Electrical Simulation using AFP Nanoprobing in wafer fabrication
Mr. Ang Ghim Boon, GLOBALFOUNDRIES Singapore Pte Ltd
A Study on ECC Failure Induced Latent Defect in between High-k MIM Capacitors
Mrs. Kim jinseon, samsung electronics; Dr. Nam incheol, samsung electronics; Dr. Kim minsoo, samsung electronics; Dr. Shin minju, samsung electronics
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