Sample Preparation Techniques for Reduced Lateral Heat Distribution and Implications for Non-IR Probing on Integrated Circuits

Thursday, November 9, 2017: 9:50 AM
Ballroom C (Pasadena Convention Center)
Mr. Matthew M. Mulholland , Intel Corporation, Santa Clara, CA
Dr. Nathan Bakken, PhD , Intel Corporation, Folsom, CA
Mr. Vladimir V. Vlasyuk , Intel Corporation, Folsom, CA
Mr. Robert P. Wadell , Intel Corporation, Folsom, CA
Mr. Imran Khan , Intel Corporation, Folsom, CA

See more of: Sample Preparation and Device Deprocessing
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