Measurement of Dielectric constant and Doping Concentration of a Cross-sectioned Device by Quantitative Scanning Microwave Impedance Microscopy

Tuesday, November 7, 2017: 1:45 PM
Ballroom A (Pasadena Convention Center)
Mr. Oskar Amster , PrimeNano, Inc., Santa Clara, CA
Dr. Stuart L friedman , PrimeNano, Inc., Palo Alto, CA
Dr. Yongliang Yang , PrimeNano, Inc., Palo Alto, CA
Dr. Dorai Iyer , ON Semiconductor, Phoenix, AZ
Mr. Rod Crowder , ON Semiconductor, Phoenix, AZ
Dr. Fred Stanke , PrimeNano, Inc., Palo Alto, CA
Mr. Aaron Messinger , ON Semiconductor, Phoenix, AZ
Dr. Yongxia Zhang , ON Semiconductor, Phoenix, AZ

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