43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
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Magnetic Imaging for Die and Package Fault Isolation
Sunday, November 5, 2017: 2:50 PM
Ballroom C (Pasadena Convention Center)
Mr. David Vallett
,
PeakSource Analytical, LLC, Fairfax, VT
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Fault Isolation II
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Tutorial