43rd International Symposium for Testing and Failure Analysis (November 5-9, 2017)
November 05 - 09, 2017
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Flip-Chip and BacksideTechniques
Sunday, November 5, 2017: 9:00 AM
Ballroom C (Pasadena Convention Center)
Dr. Edward I. Cole Jr.
,
Sandia National Laboratories, Albuquerque, NM
See more of:
Package and Physical Analysis Challenges I
See more of:
Tutorial